Conventional neutron reflection is a very powerful tool to characterise surfactants, polymers and other materials at the solid/liquid and air/liquid interfaces. Usually the analysis considers molecular layers with coherent addition of reflected waves that give the resultant reflected intensity. In this short workshop talk I will illustrate recent developments in this approach to address a wide variety of challenges of academic and commercial interest. Specifically I will introduce the challenges of using substrates that are thick on the coherence lengthscale of the radiation and the issues that brings in the structural analysis. I also invite the audience to consider if there may be some mathematical analysis that might lead us to exploit this incoherence to optimise our analysis. In particular, facilitating the removal of the 'background substrate contribution' to help us focus on the adsorbed layers of most interest.
- Industrial and Interdisciplinary Workshops