Date
Fri, 10 May 2019
Time
10:00 - 11:00
Location
L3
Speaker
Charlie Fletcher and Dan Haley
Organisation
Department of Materials Science

Atom Probe Tomography is a powerful 3D mass spectrometry technique. By pulsing the sample apex with an electric field, surface atoms are ionised and collected by a detector. A 3D image of estimated initial ion positions is constructed via an image reconstruction protocol. Current protocols assume ion trajectories follow a stereographic projection. However, this method assumes a hemispherical sample apex that fails to account for varying material ionisation rates and introduces severe distortions into atomic distributions for complex material systems.

We aim to develop continuum models and use this to derive a time-dependent mapping describing how ion initial positions on the sample surface correspond to final impact positions on the detector. When correctly calibrated with experiment, such a mapping could be used for performing reconstruction.

Currently we track the sample surface using a level set method, while the electric field is solved via BEM or a FEM-BEM coupling. These field calculations must remain accurate close to the boundary. Calibrating unknown evaporation parameters with experiment requires an ensemble of models per experiment. Therefore, we are also looking to maximise model efficiency via BEM compression methods i.e. fast multipole BEM. Efficiently constructing and reliably interpolating the non-bijective trajectory mapping, while accounting for ion trajectory overlap and instabilities (at sample surface corners), also presents intriguing problems.

This project is in collaboration with Cameca, the leading manufacturer of commercial atom probe instruments. If successful in minimising distortions such a technique could become valuable within the semiconductor industry.

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